Diffractometer for element-specific analysis on local structures using a combination of X-ray fluorescence holography and anomalous X-ray scattering
To tackle disorder in crystals and short- and intermediate-range order in amorphous materials, such as glass, we developed a carry-in diffractometer to utilise X-ray fluorescence holography (XFH) and anomalous X-ray scattering (AXS), facilitating element-specific analyses with atomic resolution usin...
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| Format: | Article |
| Language: | English |
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International Union of Crystallography
2025-01-01
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| Series: | Journal of Synchrotron Radiation |
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| Online Access: | https://journals.iucr.org/paper?S1600577524011366 |
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| author | Hiroo Tajiri Shinji Kohara Koji Kimura Sekhar Halubai Haruto Morimoto Naohisa Happo Jens R. Stellhorn Yohei Onodera Xvsheng Qiao Daisuke Urushihara Peidong Hu Toru Wakihara Toyohiko Kinoshita Koichi Hayashi |
| author_facet | Hiroo Tajiri Shinji Kohara Koji Kimura Sekhar Halubai Haruto Morimoto Naohisa Happo Jens R. Stellhorn Yohei Onodera Xvsheng Qiao Daisuke Urushihara Peidong Hu Toru Wakihara Toyohiko Kinoshita Koichi Hayashi |
| author_sort | Hiroo Tajiri |
| collection | DOAJ |
| description | To tackle disorder in crystals and short- and intermediate-range order in amorphous materials, such as glass, we developed a carry-in diffractometer to utilise X-ray fluorescence holography (XFH) and anomalous X-ray scattering (AXS), facilitating element-specific analyses with atomic resolution using the wavelength tunability of a synchrotron X-ray source. Our diffractometer unifies XFH and AXS configurations to determine the crystal orientation via diffractometry. In particular, XFH was realised even for a crystal with blurred emission lines by a standing wave in a hologram, and high-throughput AXS with sufficient count statistics and energy resolution was achieved using three multi-array detectors with crystal analysers. These features increase tractable targets by XFH and AXS, which have novel functionalities. |
| format | Article |
| id | doaj-art-25894e61ffc64c939fea5cf58a664691 |
| institution | Kabale University |
| issn | 1600-5775 |
| language | English |
| publishDate | 2025-01-01 |
| publisher | International Union of Crystallography |
| record_format | Article |
| series | Journal of Synchrotron Radiation |
| spelling | doaj-art-25894e61ffc64c939fea5cf58a6646912025-01-07T14:26:38ZengInternational Union of CrystallographyJournal of Synchrotron Radiation1600-57752025-01-0132112513210.1107/S1600577524011366ok5128Diffractometer for element-specific analysis on local structures using a combination of X-ray fluorescence holography and anomalous X-ray scatteringHiroo Tajiri0Shinji Kohara1Koji Kimura2Sekhar Halubai3Haruto Morimoto4Naohisa Happo5Jens R. Stellhorn6Yohei Onodera7Xvsheng Qiao8Daisuke Urushihara9Peidong Hu10Toru Wakihara11Toyohiko Kinoshita12Koichi Hayashi13Japan Synchrotron Radiation Research Institute, Hyogo 679-5198, JapanJapan Synchrotron Radiation Research Institute, Hyogo 679-5198, JapanJapan Synchrotron Radiation Research Institute, Hyogo 679-5198, JapanJapan Synchrotron Radiation Research Institute, Hyogo 679-5198, JapanDepartment of Physical Science and Engineering, Nagoya Institute of Technology, Nagoya 466-8555, JapanGraduate School of Information Sciences, Hiroshima City University, Hiroshima 731-3194, JapanCo-Creation Institute for Advanced Materials, Shimane University, Matsue 690-8504, JapanCenter for Basic Research on Materials, National Institute for Materials Science, Ibaraki 305-0047, JapanState Key Laboratory of Silicon Materials & School of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, ChinaDivision of Advanced Ceramics, Nagoya Institute of Technology, Nagoya 466-8555, JapanInstitute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo 113-8656, JapanInstitute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo 113-8656, JapanJapan Synchrotron Radiation Research Institute, Hyogo 679-5198, JapanJapan Synchrotron Radiation Research Institute, Hyogo 679-5198, JapanTo tackle disorder in crystals and short- and intermediate-range order in amorphous materials, such as glass, we developed a carry-in diffractometer to utilise X-ray fluorescence holography (XFH) and anomalous X-ray scattering (AXS), facilitating element-specific analyses with atomic resolution using the wavelength tunability of a synchrotron X-ray source. Our diffractometer unifies XFH and AXS configurations to determine the crystal orientation via diffractometry. In particular, XFH was realised even for a crystal with blurred emission lines by a standing wave in a hologram, and high-throughput AXS with sufficient count statistics and energy resolution was achieved using three multi-array detectors with crystal analysers. These features increase tractable targets by XFH and AXS, which have novel functionalities.https://journals.iucr.org/paper?S1600577524011366x-ray diffractometersx-ray fluorescence holographyanomalous x-ray scatteringelement-specific measurementscarry-in equipment |
| spellingShingle | Hiroo Tajiri Shinji Kohara Koji Kimura Sekhar Halubai Haruto Morimoto Naohisa Happo Jens R. Stellhorn Yohei Onodera Xvsheng Qiao Daisuke Urushihara Peidong Hu Toru Wakihara Toyohiko Kinoshita Koichi Hayashi Diffractometer for element-specific analysis on local structures using a combination of X-ray fluorescence holography and anomalous X-ray scattering Journal of Synchrotron Radiation x-ray diffractometers x-ray fluorescence holography anomalous x-ray scattering element-specific measurements carry-in equipment |
| title | Diffractometer for element-specific analysis on local structures using a combination of X-ray fluorescence holography and anomalous X-ray scattering |
| title_full | Diffractometer for element-specific analysis on local structures using a combination of X-ray fluorescence holography and anomalous X-ray scattering |
| title_fullStr | Diffractometer for element-specific analysis on local structures using a combination of X-ray fluorescence holography and anomalous X-ray scattering |
| title_full_unstemmed | Diffractometer for element-specific analysis on local structures using a combination of X-ray fluorescence holography and anomalous X-ray scattering |
| title_short | Diffractometer for element-specific analysis on local structures using a combination of X-ray fluorescence holography and anomalous X-ray scattering |
| title_sort | diffractometer for element specific analysis on local structures using a combination of x ray fluorescence holography and anomalous x ray scattering |
| topic | x-ray diffractometers x-ray fluorescence holography anomalous x-ray scattering element-specific measurements carry-in equipment |
| url | https://journals.iucr.org/paper?S1600577524011366 |
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