Mechanical response identification of local interconnections in board-level packaging structures under projectile penetration using Bayesian regularization

Modern warfare demands weapons capable of penetrating substantial structures, which presents significant challenges to the reliability of the electronic devices that are crucial to the weapon's performance. Due to miniaturization of electronic components, it is challenging to directly measure o...

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Bibliographic Details
Main Authors: Xu Long, Yuntao Hu, Irfan Ali
Format: Article
Language:English
Published: KeAi Communications Co., Ltd. 2025-07-01
Series:Defence Technology
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Online Access:http://www.sciencedirect.com/science/article/pii/S2214914725000443
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