Molecular surface coverage standards by reference-free GIXRF supporting SERS and SEIRA substrate benchmarking
Non-destructive reference-free grazing incidence X-ray fluorescence (RF-GIXRF) is proposed as a highly effective analytical technique for extracting molecular arrangement density in self-assembled monolayers. The establishment of surface density standards through RF-GIXRF impacts various application...
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| Main Authors: | , , , , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
De Gruyter
2024-08-01
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| Series: | Nanophotonics |
| Subjects: | |
| Online Access: | https://doi.org/10.1515/nanoph-2024-0222 |
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