Morphology Engineering of SnS2 Nanostructures to Stimulate PICT Resonance for Ultra‐Sensitive SERS Sensors

Morphology Engineering of SnS2 Nanostructures to Stimulate PICT Resonance for Ultra‐Sensitive SERS Sensors

ABSTRACT Recent advances indicate the surface‐enhanced Raman scattering (SERS) sensitivity of semiconductors is generally lower than that of noble metal substrates, and developing ultra‐sensitive semiconductor SERS substrates is an urgent task. Here, SnS2 with better SERS performance is screened out...

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Bibliographic Details
Main Authors: Yusi Peng, Weida Zhang, Meimei Xu, Shuai Zhao, Lili Yang, Dan Li, Masaki Tanemura, Zhengren Huang, Yong Yang
Format: Article
Language:English
Published: Wiley 2025-06-01
Series:Exploration
Subjects:
morphology engineering
PICT resonance
SnS2 nanostructures
ultra‐high SERS sensitivity
Online Access:https://doi.org/10.1002/EXP.70016
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