Brief Presentation of Near-field Test Application in EMC Diagnostic

Brief Presentation of Near-field Test Application in EMC Diagnostic

According to the problem of EMI source hard positioning in EMI test, a near-field diagnostic test systems was presented with different dimension and type near-field probe to position larger radiation point accurately, which provided a fast and effective positioning method to complete radiation EMI f...

Full description

Saved in:
Bibliographic Details
Main Authors: HOU De-chao, SHAO Rui, YANG Tian-fan
Format: Article
Language:zho
Published: Editorial Department of Electric Drive for Locomotives 2013-01-01
Series:机车电传动
Subjects:
EMC
EMI
near-field testing
diagnostic
fast positioning
Online Access:http://edl.csrzic.com/thesisDetails#10.13890/j.issn.1000-128x.2013.03.006
Tags: Add Tag
No Tags, Be the first to tag this record!

Similar Items

Similar Items