Test Methodology for Short-Circuit Assessment and Safe Operation Identification for Power SiC MOSFETs

Test Methodology for Short-Circuit Assessment and Safe Operation Identification for Power SiC MOSFETs

The short-circuit (SC) immunity of power silicon carbide (SiC) MOSFETs is critical for high-reliability applications, where robust monitoring and protection strategies are essential to ensure system safety. Despite their superior voltage blocking capabilities and high energy efficiency, SiC MOSFETs...

Full description

Saved in:
Bibliographic Details
Main Authors: Joao Oliveira, Jean-Michel Reynes, Hervé Morel, Pascal Frey, Olivier Perrotin, Laurence Allirand, Stéphane Azzopardi, Michel Piton, Fabio Coccetti
Format: Article
Language:English
Published: MDPI AG 2024-11-01
Series:Energies
Subjects:
SiC MOSFET
short circuit
test methodology
failure analysis
Online Access:https://www.mdpi.com/1996-1073/17/21/5476
Tags: Add Tag
No Tags, Be the first to tag this record!

Similar Items

Similar Items