APA (7th ed.) Citation

Seck, T., & Niang, A. Conformal Metrics to a Product or Doubly Warped Product on S2×S2 and the Hopf Conjecture. Wiley.

Chicago Style (17th ed.) Citation

Seck, Thierno, and Athoumane Niang. Conformal Metrics to a Product or Doubly Warped Product on S2×S2 and the Hopf Conjecture. Wiley.

MLA (9th ed.) Citation

Seck, Thierno, and Athoumane Niang. Conformal Metrics to a Product or Doubly Warped Product on S2×S2 and the Hopf Conjecture. Wiley.