Genome-wide association mapping identifies yellow rust resistance loci in Ethiopian durum wheat germplasm.

Genome-wide association mapping identifies yellow rust resistance loci in Ethiopian durum wheat germplasm.

Durum wheat is an important cereal grown in Ethiopia, a country which is also its center for genetic diversity. Yellow (stripe) rust caused by Puccinia striiformis fsp tritici is one of the most devastating diseases threatening Ethiopian wheat production. To identify sources of genetic resistance an...

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Bibliographic Details
Main Authors: Sisay Kidane Alemu, Ayele Badebo Huluka, Kassahun Tesfaye, Teklehaimanot Haileselassie, Cristobal Uauy
Format: Article
Language:English
Published: Public Library of Science (PLoS) 2021-01-01
Series:PLoS ONE
Online Access:https://journals.plos.org/plosone/article/file?id=10.1371/journal.pone.0243675&type=printable
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