Asl, H. J., & Yoon, J. An Analytical Approach for Fast Recovery of the LSI Properties in Magnetic Particle Imaging. Wiley.
Chicago Style (17th ed.) CitationAsl, Hamed Jabbari, and Jungwon Yoon. An Analytical Approach for Fast Recovery of the LSI Properties in Magnetic Particle Imaging. Wiley.
MLA (9th ed.) CitationAsl, Hamed Jabbari, and Jungwon Yoon. An Analytical Approach for Fast Recovery of the LSI Properties in Magnetic Particle Imaging. Wiley.
Warning: These citations may not always be 100% accurate.