Depth Profiling of the Near-Surface Layer for Ge<sub>33</sub>As<sub>12</sub>Se<sub>55</sub> Thin Films
Depth profiles of the near-surface region and chemical composition for amorphous films deposited from Ge33As12Se55 bulk glasses and their changes resulting from six months ageing under ambient conditions have been studied by the methods of Auger electron spectroscopy and X-ray photoelectron spectros...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Chuiko Institute of Surface Chemistry of NAS of Ukraine
2010-08-01
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| Series: | Хімія, фізика та технологія поверхні |
| Online Access: | https://cpts.com.ua/index.php/cpts/article/view/50 |
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