Depth Profiling of the Near-Surface Layer for Ge<sub>33</sub>As<sub>12</sub>Se<sub>55</sub> Thin Films

Depth Profiling of the Near-Surface Layer for Ge<sub>33</sub>As<sub>12</sub>Se<sub>55</sub> Thin Films

Depth profiles of the near-surface region and chemical composition for amorphous films deposited from Ge33As12Se55 bulk glasses and their changes resulting from six months ageing under ambient conditions have been studied by the methods of Auger electron spectroscopy and X-ray photoelectron spectros...

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Bibliographic Details
Main Authors:	T. N. Shchurova, N. D. Savchenko, K. O. Popovic, N. Yu. Baran
Format:	Article
Language:	English
Published:	Chuiko Institute of Surface Chemistry of NAS of Ukraine 2010-08-01
Series:	Хімія, фізика та технологія поверхні
Online Access:	https://cpts.com.ua/index.php/cpts/article/view/50
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