Depth Profiling of the Near-Surface Layer for Ge<sub>33</sub>As<sub>12</sub>Se<sub>55</sub> Thin Films
Depth profiles of the near-surface region and chemical composition for amorphous films deposited from Ge33As12Se55 bulk glasses and their changes resulting from six months ageing under ambient conditions have been studied by the methods of Auger electron spectroscopy and X-ray photoelectron spectros...
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| Format: | Article |
| Language: | English |
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Chuiko Institute of Surface Chemistry of NAS of Ukraine
2010-08-01
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| Series: | Хімія, фізика та технологія поверхні |
| Online Access: | https://cpts.com.ua/index.php/cpts/article/view/50 |
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| author | T. N. Shchurova N. D. Savchenko K. O. Popovic N. Yu. Baran |
| author_facet | T. N. Shchurova N. D. Savchenko K. O. Popovic N. Yu. Baran |
| author_sort | T. N. Shchurova |
| collection | DOAJ |
| description | Depth profiles of the near-surface region and chemical composition for amorphous films deposited from Ge33As12Se55 bulk glasses and their changes resulting from six months ageing under ambient conditions have been studied by the methods of Auger electron spectroscopy and X-ray photoelectron spectroscopy. It has been shown that there is a surface layer of about 30 nm thickness enriched with oxygen, germanium, and selenium atoms and depleted of arsenic atoms. It has been found that in the process of natural ageing in the near-surface layer of Ge33As12Se55film the decrease in the relative concentration of germanium and arsenic is observed, with the simultaneous increase in the concentration of selenium and oxygen associated with the formation of As2O3 and GeO2, oxide compounds resulting in а loosening of the surface layer. |
| format | Article |
| id | doaj-art-1d1ff10579614a6da57bdb8ebef2fde8 |
| institution | DOAJ |
| issn | 2079-1704 2518-1238 |
| language | English |
| publishDate | 2010-08-01 |
| publisher | Chuiko Institute of Surface Chemistry of NAS of Ukraine |
| record_format | Article |
| series | Хімія, фізика та технологія поверхні |
| spelling | doaj-art-1d1ff10579614a6da57bdb8ebef2fde82025-08-20T03:08:27ZengChuiko Institute of Surface Chemistry of NAS of UkraineХімія, фізика та технологія поверхні2079-17042518-12382010-08-0113Depth Profiling of the Near-Surface Layer for Ge<sub>33</sub>As<sub>12</sub>Se<sub>55</sub> Thin FilmsT. N. Shchurova0N. D. Savchenko1K. O. Popovic2N. Yu. Baran3Uzhgorod National UniversityUzhgorod National UniversityNanoTecCenter Weiz Forschungsgesellschaft mbHUzhgorod National UniversityDepth profiles of the near-surface region and chemical composition for amorphous films deposited from Ge33As12Se55 bulk glasses and their changes resulting from six months ageing under ambient conditions have been studied by the methods of Auger electron spectroscopy and X-ray photoelectron spectroscopy. It has been shown that there is a surface layer of about 30 nm thickness enriched with oxygen, germanium, and selenium atoms and depleted of arsenic atoms. It has been found that in the process of natural ageing in the near-surface layer of Ge33As12Se55film the decrease in the relative concentration of germanium and arsenic is observed, with the simultaneous increase in the concentration of selenium and oxygen associated with the formation of As2O3 and GeO2, oxide compounds resulting in а loosening of the surface layer.https://cpts.com.ua/index.php/cpts/article/view/50 |
| spellingShingle | T. N. Shchurova N. D. Savchenko K. O. Popovic N. Yu. Baran Depth Profiling of the Near-Surface Layer for Ge<sub>33</sub>As<sub>12</sub>Se<sub>55</sub> Thin Films Хімія, фізика та технологія поверхні |
| title | Depth Profiling of the Near-Surface Layer for Ge<sub>33</sub>As<sub>12</sub>Se<sub>55</sub> Thin Films |
| title_full | Depth Profiling of the Near-Surface Layer for Ge<sub>33</sub>As<sub>12</sub>Se<sub>55</sub> Thin Films |
| title_fullStr | Depth Profiling of the Near-Surface Layer for Ge<sub>33</sub>As<sub>12</sub>Se<sub>55</sub> Thin Films |
| title_full_unstemmed | Depth Profiling of the Near-Surface Layer for Ge<sub>33</sub>As<sub>12</sub>Se<sub>55</sub> Thin Films |
| title_short | Depth Profiling of the Near-Surface Layer for Ge<sub>33</sub>As<sub>12</sub>Se<sub>55</sub> Thin Films |
| title_sort | depth profiling of the near surface layer for ge sub 33 sub as sub 12 sub se sub 55 sub thin films |
| url | https://cpts.com.ua/index.php/cpts/article/view/50 |
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