Shchurova, T. N., Savchenko, N. D., Popovic, K. O., & Baran, N. Y. Depth Profiling of the Near-Surface Layer for Ge<sub>33</sub>As<sub>12</sub>Se<sub>55</sub> Thin Films. Chuiko Institute of Surface Chemistry of NAS of Ukraine.
Chicago Style (17th ed.) CitationShchurova, T. N., N. D. Savchenko, K. O. Popovic, and N. Yu Baran. Depth Profiling of the Near-Surface Layer for Ge<sub>33</sub>As<sub>12</sub>Se<sub>55</sub> Thin Films. Chuiko Institute of Surface Chemistry of NAS of Ukraine.
MLA (9th ed.) CitationShchurova, T. N., et al. Depth Profiling of the Near-Surface Layer for Ge<sub>33</sub>As<sub>12</sub>Se<sub>55</sub> Thin Films. Chuiko Institute of Surface Chemistry of NAS of Ukraine.
Warning: These citations may not always be 100% accurate.