APA (7th ed.) Citation

Hsu, H., Yang, P., Huang, J., Wu, P., Huang, Y., Li, C., . . . Tiong, K. Photoreflectance Spectroscopy Characterization of Ge/Si0.16Ge0.84 Multiple Quantum Wells on Ge Virtual Substrate. Wiley.

Chicago Style (17th ed.) Citation

Hsu, Hung-Pin, Pong-Hong Yang, Jeng-Kuang Huang, Po-Hung Wu, Ying-Sheng Huang, Cheng Li, Shi-Hao Huang, and Kwong-Kau Tiong. Photoreflectance Spectroscopy Characterization of Ge/Si0.16Ge0.84 Multiple Quantum Wells on Ge Virtual Substrate. Wiley.

MLA (9th ed.) Citation

Hsu, Hung-Pin, et al. Photoreflectance Spectroscopy Characterization of Ge/Si0.16Ge0.84 Multiple Quantum Wells on Ge Virtual Substrate. Wiley.