Efficient Wideband Characterization of Low-Height RF Substrates Using a Destructive Measurement Approach

Efficient Wideband Characterization of Low-Height RF Substrates Using a Destructive Measurement Approach

This paper presents a validated, cost-effective technique for the wideband characterization of low-height substrate materials in RF circuits. The method utilizes traditional resonant structures to accurately determine essential parameters—relative permittivity and loss tangent—and delivers reliable...

Full description

Saved in:
Bibliographic Details
Main Authors: Georges Zakka El Nashef, Abdel Karim Abdel Karim, Sawsan Sadek
Format: Article
Language:English
Published: MDPI AG 2025-06-01
Series:Eng
Subjects:
substrate characterization
low-height materials
multimode patch antenna
electromagnetic simulations
Online Access:https://www.mdpi.com/2673-4117/6/7/139
Tags: Add Tag
No Tags, Be the first to tag this record!

Similar Items

Similar Items