APA (7th ed.) Citation

Nashef, G. Z. E., Karim, A. K. A., & Sadek, S. Efficient Wideband Characterization of Low-Height RF Substrates Using a Destructive Measurement Approach. MDPI AG.

Chicago Style (17th ed.) Citation

Nashef, Georges Zakka El, Abdel Karim Abdel Karim, and Sawsan Sadek. Efficient Wideband Characterization of Low-Height RF Substrates Using a Destructive Measurement Approach. MDPI AG.

MLA (9th ed.) Citation

Nashef, Georges Zakka El, et al. Efficient Wideband Characterization of Low-Height RF Substrates Using a Destructive Measurement Approach. MDPI AG.