ToF-SIMS sputter depth profiling of interphases and coatings on lithium metal surfaces
Abstract Lithium metal as a negative electrode material offers ten times the specific capacity of graphitic electrodes, but its rechargeable operation poses challenges like excessive and continuous interphase formation, high surface area lithium deposits and safety issues. Improving the lithium | el...
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| Format: | Article |
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Nature Portfolio
2025-02-01
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| Series: | Communications Chemistry |
| Online Access: | https://doi.org/10.1038/s42004-025-01426-0 |
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| author | Maximilian Mense Marlena M. Bela Sebastian P. Kühn Isidora Cekic-Laskovic Markus Börner Simon Wiemers-Meyer Martin Winter Sascha Nowak |
| author_facet | Maximilian Mense Marlena M. Bela Sebastian P. Kühn Isidora Cekic-Laskovic Markus Börner Simon Wiemers-Meyer Martin Winter Sascha Nowak |
| author_sort | Maximilian Mense |
| collection | DOAJ |
| description | Abstract Lithium metal as a negative electrode material offers ten times the specific capacity of graphitic electrodes, but its rechargeable operation poses challenges like excessive and continuous interphase formation, high surface area lithium deposits and safety issues. Improving the lithium | electrolyte interface and interphase requires powerful surface analysis techniques, such as ToF-SIMS sputter depth profiling.This study investigates lithium metal sections with an SEI layer by ToF-SIMS using different sputter ions. An optimal sputter ion is chosen based on the measured ToF-SIMS sputter depth profiles and SEM analysis of the surface damage. Further, this method is adapted to lithium metal foil with an intermetallic coating. ToF-SIMS sputter depth profiles in both polarities provide comprehensive insights into the coating structure. Both investigations highlight the value of ToF-SIMS sputter depth profiling in lithium metal battery research and offer guidance for future studies. |
| format | Article |
| id | doaj-art-1bb142501ad143978f6d63695cd1d29f |
| institution | Kabale University |
| issn | 2399-3669 |
| language | English |
| publishDate | 2025-02-01 |
| publisher | Nature Portfolio |
| record_format | Article |
| series | Communications Chemistry |
| spelling | doaj-art-1bb142501ad143978f6d63695cd1d29f2025-02-09T12:16:22ZengNature PortfolioCommunications Chemistry2399-36692025-02-01811810.1038/s42004-025-01426-0ToF-SIMS sputter depth profiling of interphases and coatings on lithium metal surfacesMaximilian Mense0Marlena M. Bela1Sebastian P. Kühn2Isidora Cekic-Laskovic3Markus Börner4Simon Wiemers-Meyer5Martin Winter6Sascha Nowak7Münster Electrochemical Energy Technology (MEET), University of MünsterMünster Electrochemical Energy Technology (MEET), University of MünsterHelmholtz-Institute Münster, IMD-4, Forschungszentrum Jülich GmbHHelmholtz-Institute Münster, IMD-4, Forschungszentrum Jülich GmbHMünster Electrochemical Energy Technology (MEET), University of MünsterMünster Electrochemical Energy Technology (MEET), University of MünsterMünster Electrochemical Energy Technology (MEET), University of MünsterMünster Electrochemical Energy Technology (MEET), University of MünsterAbstract Lithium metal as a negative electrode material offers ten times the specific capacity of graphitic electrodes, but its rechargeable operation poses challenges like excessive and continuous interphase formation, high surface area lithium deposits and safety issues. Improving the lithium | electrolyte interface and interphase requires powerful surface analysis techniques, such as ToF-SIMS sputter depth profiling.This study investigates lithium metal sections with an SEI layer by ToF-SIMS using different sputter ions. An optimal sputter ion is chosen based on the measured ToF-SIMS sputter depth profiles and SEM analysis of the surface damage. Further, this method is adapted to lithium metal foil with an intermetallic coating. ToF-SIMS sputter depth profiles in both polarities provide comprehensive insights into the coating structure. Both investigations highlight the value of ToF-SIMS sputter depth profiling in lithium metal battery research and offer guidance for future studies.https://doi.org/10.1038/s42004-025-01426-0 |
| spellingShingle | Maximilian Mense Marlena M. Bela Sebastian P. Kühn Isidora Cekic-Laskovic Markus Börner Simon Wiemers-Meyer Martin Winter Sascha Nowak ToF-SIMS sputter depth profiling of interphases and coatings on lithium metal surfaces Communications Chemistry |
| title | ToF-SIMS sputter depth profiling of interphases and coatings on lithium metal surfaces |
| title_full | ToF-SIMS sputter depth profiling of interphases and coatings on lithium metal surfaces |
| title_fullStr | ToF-SIMS sputter depth profiling of interphases and coatings on lithium metal surfaces |
| title_full_unstemmed | ToF-SIMS sputter depth profiling of interphases and coatings on lithium metal surfaces |
| title_short | ToF-SIMS sputter depth profiling of interphases and coatings on lithium metal surfaces |
| title_sort | tof sims sputter depth profiling of interphases and coatings on lithium metal surfaces |
| url | https://doi.org/10.1038/s42004-025-01426-0 |
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