Voltage mapping relationship based single-phase-to-ground fault sector location method for low resistance neutral grounded system
With the increasing deployment of Transformer Distribution-Smart Fusion Terminal(TD-SFT), Low-Voltage (LV) monitoring data are becoming more abundant. However, this data is primarily leveraged for source-load control, leaving significant room for enhanced utilization. This paper presents a method to...
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| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2025-09-01
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| Series: | International Journal of Electrical Power & Energy Systems |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S0142061525004612 |
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| Summary: | With the increasing deployment of Transformer Distribution-Smart Fusion Terminal(TD-SFT), Low-Voltage (LV) monitoring data are becoming more abundant. However, this data is primarily leveraged for source-load control, leaving significant room for enhanced utilization. This paper presents a method to utilize LV voltage amplitude monitoring information to derive Medium-Voltage (MV) electrical quantities via inverse calculation, addressing the challenge of locating single-phase-to-ground fault sectors in low resistance distribution networks. First, we establish a mapping relationship between LV voltage magnitudes and MV voltage phasors. Next, using the derived MV electrical quantities alongside network topology and equivalent parameters, we calculate the positive-sequence fault current component. The ’clustering-cleaning-difference’ approach amplifies distribution characteristics, and we propose criteria for fault sector location, as well as selection criteria for fault phases and lines based on voltage characteristics. Simulation results validate the method’s effectiveness and analyze the impacts of fault location, transition resistance, load fluctuation, timing errors and distributed power integration. This approach offers innovative strategies for maximizing the utility of LV monitoring data and holds significant application potential. |
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| ISSN: | 0142-0615 |