Accelerate Aging Test Method for Press-Pack IGBT Power Module

Since reliability test of Press-pack IGBT (PPI) still not been researched enough, based on its application in industry, A cycle aging test methods aimed at VSC-HVDC power unit are proposed. The junction temperature formulas for all test methods are obtained by analyzing promising test waveforms and...

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Bibliographic Details
Main Authors: Biaojun LI, Haiyang CHU, Zhifa ZHUANG, Jun WEN
Format: Article
Language:zho
Published: State Grid Energy Research Institute 2022-10-01
Series:Zhongguo dianli
Subjects:
Online Access:https://www.electricpower.com.cn/CN/10.11930/j.issn.1004-9649.202108087
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Summary:Since reliability test of Press-pack IGBT (PPI) still not been researched enough, based on its application in industry, A cycle aging test methods aimed at VSC-HVDC power unit are proposed. The junction temperature formulas for all test methods are obtained by analyzing promising test waveforms and thermal impedance models under the specific test conditions. Experiments results illustrate measured junction temperature waveforms of PPI that under the aging tests, and proposed methods are validated.
ISSN:1004-9649