Development of a Portable Optomechatronic System to Obtain the Characterization of Transparent Materials and Dielectric Thin Films
This paper outlines the design and fabrication of a portable optomechatronic system based on the theta-2theta configuration, which explores various optical characterization techniques for transparent materials and dielectric thin films. These techniques include Brewster angle and Abelès-Brewster ang...
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| Format: | Article |
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MDPI AG
2024-12-01
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| Series: | Optics |
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| Online Access: | https://www.mdpi.com/2673-3269/5/4/44 |
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| author | Araceli Sánchez-Alvarez Osvaldo Rodríguez-Quiroz Gabriela Elizabeth Quintanilla-Villanueva Melissa Marlene Rodríguez-Delgado Juan Francisco Villarreal-Chiu Oscar Javier Silva-Hernández Donato Luna-Moreno |
| author_facet | Araceli Sánchez-Alvarez Osvaldo Rodríguez-Quiroz Gabriela Elizabeth Quintanilla-Villanueva Melissa Marlene Rodríguez-Delgado Juan Francisco Villarreal-Chiu Oscar Javier Silva-Hernández Donato Luna-Moreno |
| author_sort | Araceli Sánchez-Alvarez |
| collection | DOAJ |
| description | This paper outlines the design and fabrication of a portable optomechatronic system based on the theta-2theta configuration, which explores various optical characterization techniques for transparent materials and dielectric thin films. These techniques include Brewster angle and Abelès-Brewster angle measurements, critical angle measurements, and the surface plasmon resonance technique. The system consists of a mechanical assembly of rotating stages, a semiconductor laser, a photodiode connected to a data acquisition card, and a user interface for controlling the stepper motor rotation stages. Utilizing a BK7 substrate, the motorized stage achieved a resolution of 0.010. The Brewster angle measured was 56.550, with a refractive index (n) of 1.5137. The relative error obtained was Δn/n = 3.82 × 10<sup>−4</sup>, with a sensitivity of 164.27 RIU/degree and an accuracy of 0.37/degree. Furthermore, the discrepancies between theoretical and experimental refractive indices for different prisms at 639 nm ranged from ±7 × 10<sup>−4</sup> to ±73 × 10<sup>−4</sup>. After testing various samples, the system demonstrated its capability to perform fast, precise, and non-invasive measurements. Its portability allows for use in diverse environments and applications. |
| format | Article |
| id | doaj-art-16a6d46748064bfaa120c4a51cbf5f84 |
| institution | DOAJ |
| issn | 2673-3269 |
| language | English |
| publishDate | 2024-12-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Optics |
| spelling | doaj-art-16a6d46748064bfaa120c4a51cbf5f842025-08-20T02:50:42ZengMDPI AGOptics2673-32692024-12-015459561010.3390/opt5040044Development of a Portable Optomechatronic System to Obtain the Characterization of Transparent Materials and Dielectric Thin FilmsAraceli Sánchez-Alvarez0Osvaldo Rodríguez-Quiroz1Gabriela Elizabeth Quintanilla-Villanueva2Melissa Marlene Rodríguez-Delgado3Juan Francisco Villarreal-Chiu4Oscar Javier Silva-Hernández5Donato Luna-Moreno6Electromecánica Industrial, Universidad Tecnológica de León, Blvd. Universidad Tecnológica 225, Col. San Carlos, León 37670, Guanajuato, MexicoCentro de Investigaciones en Óptica, A. C., Loma Del Bosque 115, León 37150, Guanajuato, MexicoCentro de Investigaciones en Óptica, A. C., Loma Del Bosque 115, León 37150, Guanajuato, MexicoFacultad de Ciencias Químicas, Universidad Autónoma de Nuevo León, Av. Universidad S/N Ciudad Universitaria, San Nicolás de los Garza 66455, Nuevo León, MexicoFacultad de Ciencias Químicas, Universidad Autónoma de Nuevo León, Av. Universidad S/N Ciudad Universitaria, San Nicolás de los Garza 66455, Nuevo León, MexicoCentro de Investigaciones en Óptica, A. C., Loma Del Bosque 115, León 37150, Guanajuato, MexicoCentro de Investigaciones en Óptica, A. C., Loma Del Bosque 115, León 37150, Guanajuato, MexicoThis paper outlines the design and fabrication of a portable optomechatronic system based on the theta-2theta configuration, which explores various optical characterization techniques for transparent materials and dielectric thin films. These techniques include Brewster angle and Abelès-Brewster angle measurements, critical angle measurements, and the surface plasmon resonance technique. The system consists of a mechanical assembly of rotating stages, a semiconductor laser, a photodiode connected to a data acquisition card, and a user interface for controlling the stepper motor rotation stages. Utilizing a BK7 substrate, the motorized stage achieved a resolution of 0.010. The Brewster angle measured was 56.550, with a refractive index (n) of 1.5137. The relative error obtained was Δn/n = 3.82 × 10<sup>−4</sup>, with a sensitivity of 164.27 RIU/degree and an accuracy of 0.37/degree. Furthermore, the discrepancies between theoretical and experimental refractive indices for different prisms at 639 nm ranged from ±7 × 10<sup>−4</sup> to ±73 × 10<sup>−4</sup>. After testing various samples, the system demonstrated its capability to perform fast, precise, and non-invasive measurements. Its portability allows for use in diverse environments and applications.https://www.mdpi.com/2673-3269/5/4/44surface plasmon resonancethin filmrefractive indexoptical sensoroptical instrumentation |
| spellingShingle | Araceli Sánchez-Alvarez Osvaldo Rodríguez-Quiroz Gabriela Elizabeth Quintanilla-Villanueva Melissa Marlene Rodríguez-Delgado Juan Francisco Villarreal-Chiu Oscar Javier Silva-Hernández Donato Luna-Moreno Development of a Portable Optomechatronic System to Obtain the Characterization of Transparent Materials and Dielectric Thin Films Optics surface plasmon resonance thin film refractive index optical sensor optical instrumentation |
| title | Development of a Portable Optomechatronic System to Obtain the Characterization of Transparent Materials and Dielectric Thin Films |
| title_full | Development of a Portable Optomechatronic System to Obtain the Characterization of Transparent Materials and Dielectric Thin Films |
| title_fullStr | Development of a Portable Optomechatronic System to Obtain the Characterization of Transparent Materials and Dielectric Thin Films |
| title_full_unstemmed | Development of a Portable Optomechatronic System to Obtain the Characterization of Transparent Materials and Dielectric Thin Films |
| title_short | Development of a Portable Optomechatronic System to Obtain the Characterization of Transparent Materials and Dielectric Thin Films |
| title_sort | development of a portable optomechatronic system to obtain the characterization of transparent materials and dielectric thin films |
| topic | surface plasmon resonance thin film refractive index optical sensor optical instrumentation |
| url | https://www.mdpi.com/2673-3269/5/4/44 |
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