Radiation Hardened Read-Stability and Speed Enhanced SRAM for Space Applications

With the advancement of CMOS technology, the susceptibility of SRAM to single node upset (SNU), double node upset (DNU), and multiple node upset (MNU) induced by radiation has increased. To address this issue, various cutting-edge solutions, such as radiation hardened sextuple cross coupled (RHSCC)-...

Full description

Saved in:
Bibliographic Details
Main Authors: Woo Chang Choi, Sung-Hun Jo
Format: Article
Language:English
Published: MDPI AG 2024-10-01
Series:Applied Sciences
Subjects:
Online Access:https://www.mdpi.com/2076-3417/14/19/9015
Tags: Add Tag
No Tags, Be the first to tag this record!