Retention Characteristics of CBTi144 Thin Films Explained by Means of X-Ray Photoemission Spectroscopy
CaBi4Ti4O15 (CBTi144) thin films were grown on Pt/Ti/SiO2/Si substrates using a soft chemical solution and spin-coating method. Structure and morphology of the films were characterized by the X-ray Diffraction (XRD), Fourier-transform infrared spectroscopy (FT-IR), Raman analysis, X-ray photoemissio...
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| Format: | Article |
| Language: | English |
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Wiley
2010-01-01
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| Series: | Advances in Materials Science and Engineering |
| Online Access: | http://dx.doi.org/10.1155/2010/710269 |
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| author | G. Biasotto A. Z. Simões C. S. Riccardi M. A. Zaghete E. Longo J. A. Varela |
| author_facet | G. Biasotto A. Z. Simões C. S. Riccardi M. A. Zaghete E. Longo J. A. Varela |
| author_sort | G. Biasotto |
| collection | DOAJ |
| description | CaBi4Ti4O15 (CBTi144) thin films were grown on Pt/Ti/SiO2/Si substrates using a soft chemical solution and spin-coating method. Structure and morphology of the films were characterized by the X-ray Diffraction (XRD), Fourier-transform infrared spectroscopy (FT-IR), Raman analysis, X-ray photoemission spectroscopy (XPS), and transmission electron microscopy (TEM). The films present a single phase of layered-structured perovskite with polar axis orient. The a/b-axis orientation of the ferroelectric film is considered to be associated with the preferred orientation of the Pt bottom electrode. XPS measurements were employed to understand the nature of defects on the retention behavior of CBTi144 films. We have observed that the main source of retention-free characteristic of the capacitors is the oxygen environment in the CBTi144 lattice. |
| format | Article |
| id | doaj-art-14e2c158f20b41adaa0f968cdda4fbc3 |
| institution | Kabale University |
| issn | 1687-8434 1687-8442 |
| language | English |
| publishDate | 2010-01-01 |
| publisher | Wiley |
| record_format | Article |
| series | Advances in Materials Science and Engineering |
| spelling | doaj-art-14e2c158f20b41adaa0f968cdda4fbc32025-08-20T03:54:29ZengWileyAdvances in Materials Science and Engineering1687-84341687-84422010-01-01201010.1155/2010/710269710269Retention Characteristics of CBTi144 Thin Films Explained by Means of X-Ray Photoemission SpectroscopyG. Biasotto0A. Z. Simões1C. S. Riccardi2M. A. Zaghete3E. Longo4J. A. Varela5Laboratório Interdisciplinar em Cerâmica, Departamento de Físico-Química, Instituto de Química, Universidade Estadual Paulista, R. Francisco Degni, s/n, Bairro Quitandinha, 14801-970 Araraquara, SP, BrazilUniversidade Federal de Itajubá-Unifei, Campus Itabira, Rua São Paulo, 377, 35900-373 Bairro Amazonas-Itabira MG, BrazilLaboratório Interdisciplinar em Cerâmica, Departamento de Físico-Química, Instituto de Química, Universidade Estadual Paulista, R. Francisco Degni, s/n, Bairro Quitandinha, 14801-970 Araraquara, SP, BrazilLaboratório Interdisciplinar em Cerâmica, Departamento de Físico-Química, Instituto de Química, Universidade Estadual Paulista, R. Francisco Degni, s/n, Bairro Quitandinha, 14801-970 Araraquara, SP, BrazilLaboratório Interdisciplinar em Cerâmica, Departamento de Físico-Química, Instituto de Química, Universidade Estadual Paulista, R. Francisco Degni, s/n, Bairro Quitandinha, 14801-970 Araraquara, SP, BrazilLaboratório Interdisciplinar em Cerâmica, Departamento de Físico-Química, Instituto de Química, Universidade Estadual Paulista, R. Francisco Degni, s/n, Bairro Quitandinha, 14801-970 Araraquara, SP, BrazilCaBi4Ti4O15 (CBTi144) thin films were grown on Pt/Ti/SiO2/Si substrates using a soft chemical solution and spin-coating method. Structure and morphology of the films were characterized by the X-ray Diffraction (XRD), Fourier-transform infrared spectroscopy (FT-IR), Raman analysis, X-ray photoemission spectroscopy (XPS), and transmission electron microscopy (TEM). The films present a single phase of layered-structured perovskite with polar axis orient. The a/b-axis orientation of the ferroelectric film is considered to be associated with the preferred orientation of the Pt bottom electrode. XPS measurements were employed to understand the nature of defects on the retention behavior of CBTi144 films. We have observed that the main source of retention-free characteristic of the capacitors is the oxygen environment in the CBTi144 lattice.http://dx.doi.org/10.1155/2010/710269 |
| spellingShingle | G. Biasotto A. Z. Simões C. S. Riccardi M. A. Zaghete E. Longo J. A. Varela Retention Characteristics of CBTi144 Thin Films Explained by Means of X-Ray Photoemission Spectroscopy Advances in Materials Science and Engineering |
| title | Retention Characteristics of CBTi144 Thin Films Explained by Means of X-Ray Photoemission Spectroscopy |
| title_full | Retention Characteristics of CBTi144 Thin Films Explained by Means of X-Ray Photoemission Spectroscopy |
| title_fullStr | Retention Characteristics of CBTi144 Thin Films Explained by Means of X-Ray Photoemission Spectroscopy |
| title_full_unstemmed | Retention Characteristics of CBTi144 Thin Films Explained by Means of X-Ray Photoemission Spectroscopy |
| title_short | Retention Characteristics of CBTi144 Thin Films Explained by Means of X-Ray Photoemission Spectroscopy |
| title_sort | retention characteristics of cbti144 thin films explained by means of x ray photoemission spectroscopy |
| url | http://dx.doi.org/10.1155/2010/710269 |
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