A Low-Power Read-Decoupled Radiation-Hardened 16T SRAM for Space Applications

A Low-Power Read-Decoupled Radiation-Hardened 16T SRAM for Space Applications

Advancements in CMOS technology have significantly reduced both transistor dimensions and inter-device spacing, leading to a lower critical charge at sensitive nodes. As a result, SRAM cells used in space applications have become increasingly vulnerable to single-event upset (SEU) caused by the hars...

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Bibliographic Details
Main Authors: Sung-Jun Lim, Sung-Hun Jo
Format: Article
Language:English
Published: MDPI AG 2025-06-01
Series:Applied Sciences
Subjects:
radiation-hardened
single-event upset
soft error
space applications
static random-access memory
Online Access:https://www.mdpi.com/2076-3417/15/12/6536
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