Electric field probe calibration method by using a TEM cell for reference field generation
The article presents a method to calibrate electric field probes using a transverse electromagnetic (TEM) cell as a reference. The TEM cell generates uniform and repeatable fields for accurate calibration. The process and setup are carefully detailed to ensure precise generation and measurement. We...
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| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
EDP Sciences
2025-01-01
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| Series: | EPJ Web of Conferences |
| Online Access: | https://www.epj-conferences.org/articles/epjconf/pdf/2025/08/epjconf_cim2025_12001.pdf |
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| Summary: | The article presents a method to calibrate electric field probes using a transverse electromagnetic (TEM) cell as a reference. The TEM cell generates uniform and repeatable fields for accurate calibration. The process and setup are carefully detailed to ensure precise generation and measurement. We perform a full uncertainty analysis, considering factors like power delivery, septum-to-wall distance, impedance mismatch, and field inhomogeneity. The total uncertainty of the calibration is 10 % of the electric field amplitude, ensuring good accuracy. To validate the method, measurements are compared with data from an accredited laboratory over a frequency range of 9 kHz to 300 MHz. The results show excellent agreement, with errors within acceptable limits. This confirms the reliability and robustness of the method. The proposed approach provides a reliable solution for accurate electric field probe calibration. |
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| ISSN: | 2100-014X |