A Novel Long Short-Term Memory-Based Approach for Microgrid Fault Detection and Classification Using the Wavelet Scattering Transform

A Novel Long Short-Term Memory-Based Approach for Microgrid Fault Detection and Classification Using the Wavelet Scattering Transform

Protecting microgrids poses significant challenges owing to their diverse operational modes, multiple power infeed sources, variable fault current levels, heterogeneous control strategies, and the high penetration of intermittent renewable energy sources (RESs). These characteristics undermine the e...

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Bibliographic Details
Main Authors: Naema M. Mansour, Abdelazeem A. Abdelsalam, Ibrahim A. Awaad
Format: Article
Language:English
Published: IEEE 2025-01-01
Series:IEEE Access
Subjects:
CERT microgrid
fault identification
fault classification
DWT
WST
feature matrices
Online Access:https://ieeexplore.ieee.org/document/11059965/
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