Wide-Field Kerr Microscopy and Magnetometry on Cr₂Ge₂Te₆ Exfoliated van-der-Waals Flakes
The potential of wide-field magneto-optical Kerr microscopy for the characterisation of low-dimensional van-der-Waals crystals is explored using the example of Cr₂Ge₂Te₆ flakes in the ten nanometers thickness range. Although the magnetic domains with an expected widt...
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| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2024-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10771764/ |
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