APA (7th ed.) Citation

Li, M., Xu, X., Li, X., Li, Y., Shi, Y., Sun, Q., & Zhu, H. Aging Analysis and Degradation Prediction of PLL Circuits in 14-nm FinFET Technology. IEEE.

Chicago Style (17th ed.) Citation

Li, Meng, Xin Xu, Xianghui Li, Yunpeng Li, Yiqun Shi, Qingqing Sun, and Hao Zhu. Aging Analysis and Degradation Prediction of PLL Circuits in 14-nm FinFET Technology. IEEE.

MLA (9th ed.) Citation

Li, Meng, et al. Aging Analysis and Degradation Prediction of PLL Circuits in 14-nm FinFET Technology. IEEE.