Intrinsic challenges in x-ray spectrometry instrumentation with CdTe diode detector
The X-ray spectrometry is subject to a diversity of problems that distort the measured beam. To observe them, spectra from N20, N25, N30, N60, N80, and N100 radiation qualities were obtained and evaluated their non-correction impact in the values of mean energy when compared with the requirements on...
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| Format: | Article |
| Language: | English |
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Brazilian Radiation Protection Society (Sociedade Brasileira de Proteção Radiológica, SBPR)
2021-08-01
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| Series: | Brazilian Journal of Radiation Sciences |
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| Online Access: | https://bjrs.org.br/revista/index.php/REVISTA/article/view/1665 |
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| author | Matheus Rebello do Nascimento Jose Guilherme Pereira Peixoto Leonardo de Castro Pacífico Eric Matos Macêdo |
| author_facet | Matheus Rebello do Nascimento Jose Guilherme Pereira Peixoto Leonardo de Castro Pacífico Eric Matos Macêdo |
| author_sort | Matheus Rebello do Nascimento |
| collection | DOAJ |
| description | The X-ray spectrometry is subject to a diversity of problems that distort the measured beam. To observe them, spectra from N20, N25, N30, N60, N80, and N100 radiation qualities were obtained and evaluated their non-correction impact in the values of mean energy when compared with the requirements on ISO 4037-1 standard. The error percentages calculated were 2%, 2%, 2%, 11%, 9%, and 6%, respectively, related to partial energy deposition, efficiency loss, and charge trapping. These results suggest the need for correction of measured spectra, mainly for voltages higher than 30 kV. |
| format | Article |
| id | doaj-art-11467d89fcea41c2ab4b6c853f498ae1 |
| institution | Kabale University |
| issn | 2319-0612 |
| language | English |
| publishDate | 2021-08-01 |
| publisher | Brazilian Radiation Protection Society (Sociedade Brasileira de Proteção Radiológica, SBPR) |
| record_format | Article |
| series | Brazilian Journal of Radiation Sciences |
| spelling | doaj-art-11467d89fcea41c2ab4b6c853f498ae12025-08-20T03:27:52ZengBrazilian Radiation Protection Society (Sociedade Brasileira de Proteção Radiológica, SBPR)Brazilian Journal of Radiation Sciences2319-06122021-08-0192C (Suppl.)10.15392/bjrs.v9i2C.16651299Intrinsic challenges in x-ray spectrometry instrumentation with CdTe diode detectorMatheus Rebello do Nascimento0Jose Guilherme Pereira Peixoto1Leonardo de Castro Pacífico2Eric Matos Macêdo3Universidade do Estado do Rio de Janeiro e Instituto de Radioproteção e DosimetriaInstituto de Radioproteção e Dosimetria e Universidade do Estado do Rio de JaneiroInstituto de Radioproteção e Dosimetria e Universidade do Estado do Rio de JaneiroInstituto de Radioproteção e Dosimetria e Instituto Federal de Educação, Ciência e Tecnologia da BahiaThe X-ray spectrometry is subject to a diversity of problems that distort the measured beam. To observe them, spectra from N20, N25, N30, N60, N80, and N100 radiation qualities were obtained and evaluated their non-correction impact in the values of mean energy when compared with the requirements on ISO 4037-1 standard. The error percentages calculated were 2%, 2%, 2%, 11%, 9%, and 6%, respectively, related to partial energy deposition, efficiency loss, and charge trapping. These results suggest the need for correction of measured spectra, mainly for voltages higher than 30 kV.https://bjrs.org.br/revista/index.php/REVISTA/article/view/1665x-ray spectrometrycdte spectrometeriso 4037-1 |
| spellingShingle | Matheus Rebello do Nascimento Jose Guilherme Pereira Peixoto Leonardo de Castro Pacífico Eric Matos Macêdo Intrinsic challenges in x-ray spectrometry instrumentation with CdTe diode detector Brazilian Journal of Radiation Sciences x-ray spectrometry cdte spectrometer iso 4037-1 |
| title | Intrinsic challenges in x-ray spectrometry instrumentation with CdTe diode detector |
| title_full | Intrinsic challenges in x-ray spectrometry instrumentation with CdTe diode detector |
| title_fullStr | Intrinsic challenges in x-ray spectrometry instrumentation with CdTe diode detector |
| title_full_unstemmed | Intrinsic challenges in x-ray spectrometry instrumentation with CdTe diode detector |
| title_short | Intrinsic challenges in x-ray spectrometry instrumentation with CdTe diode detector |
| title_sort | intrinsic challenges in x ray spectrometry instrumentation with cdte diode detector |
| topic | x-ray spectrometry cdte spectrometer iso 4037-1 |
| url | https://bjrs.org.br/revista/index.php/REVISTA/article/view/1665 |
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