Intrinsic challenges in x-ray spectrometry instrumentation with CdTe diode detector
The X-ray spectrometry is subject to a diversity of problems that distort the measured beam. To observe them, spectra from N20, N25, N30, N60, N80, and N100 radiation qualities were obtained and evaluated their non-correction impact in the values of mean energy when compared with the requirements on...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Brazilian Radiation Protection Society (Sociedade Brasileira de Proteção Radiológica, SBPR)
2021-08-01
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| Series: | Brazilian Journal of Radiation Sciences |
| Subjects: | |
| Online Access: | https://bjrs.org.br/revista/index.php/REVISTA/article/view/1665 |
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| Summary: | The X-ray spectrometry is subject to a diversity of problems that distort the measured beam. To observe them, spectra from N20, N25, N30, N60, N80, and N100 radiation qualities were obtained and evaluated their non-correction impact in the values of mean energy when compared with the requirements on ISO 4037-1 standard. The error percentages calculated were 2%, 2%, 2%, 11%, 9%, and 6%, respectively, related to partial energy deposition, efficiency loss, and charge trapping. These results suggest the need for correction of measured spectra, mainly for voltages higher than 30 kV. |
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| ISSN: | 2319-0612 |