A Single Waveguide Spectrometer via Defect Scattering
Miniaturized spectrometers show great application potential in biology, medicine, astronomy and so on. However, it is still challenging to obtain broadband spectrum and high spectral resolution simultaneously with limited size. In this study, we proposed a single waveguide spectrometer based on ligh...
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| Format: | Article |
| Language: | English |
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IEEE
2025-01-01
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| Series: | IEEE Photonics Journal |
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| Online Access: | https://ieeexplore.ieee.org/document/10937772/ |
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| author | Xue Tong Zhenning Zhao Yunxian Zhong Dong Lin Zhuangzhuang Zhu Qing Zhong Jinping He |
| author_facet | Xue Tong Zhenning Zhao Yunxian Zhong Dong Lin Zhuangzhuang Zhu Qing Zhong Jinping He |
| author_sort | Xue Tong |
| collection | DOAJ |
| description | Miniaturized spectrometers show great application potential in biology, medicine, astronomy and so on. However, it is still challenging to obtain broadband spectrum and high spectral resolution simultaneously with limited size. In this study, we proposed a single waveguide spectrometer based on light scattering of the defects buried in the waveguide. The detections of the scattering light are set on the upper surface of the waveguide, as a result, tremendous detection channels can be realized even within a small structure size, which makes simultaneously high resolution and broad bandwidth detection achievable. Simulation studies show that this kind of spectrometer can exhibits an impressive bandwidth of 1000 nm, ranging from 600 to 1600 nm. Additionally, a resolution of 0.2 nm is achieved within the range of 850 to 852 nm through fine sampling. The influence factors of the performance of the spectrometer is also studied. This work provides the possibility of achieving on-chip, high-resolution, and wide-bandwidth spectrometers. |
| format | Article |
| id | doaj-art-10d54aa516df42f189e0769dd09525a0 |
| institution | OA Journals |
| issn | 1943-0655 |
| language | English |
| publishDate | 2025-01-01 |
| publisher | IEEE |
| record_format | Article |
| series | IEEE Photonics Journal |
| spelling | doaj-art-10d54aa516df42f189e0769dd09525a02025-08-20T02:09:34ZengIEEEIEEE Photonics Journal1943-06552025-01-011721810.1109/JPHOT.2025.355402210937772A Single Waveguide Spectrometer via Defect ScatteringXue Tong0Zhenning Zhao1Yunxian Zhong2Dong Lin3Zhuangzhuang Zhu4Qing Zhong5Jinping He6https://orcid.org/0000-0002-1899-3384Laboratory of Solar and Space Instruments, Nanjing Institute of Astronomical Optics & Technology, Chinese Academy of Sciences, Nanjing, ChinaLaboratory of Solar and Space Instruments, Nanjing Institute of Astronomical Optics & Technology, Chinese Academy of Sciences, Nanjing, ChinaLaboratory of Solar and Space Instruments, Nanjing Institute of Astronomical Optics & Technology, Chinese Academy of Sciences, Nanjing, ChinaLaboratory of Solar and Space Instruments, Nanjing Institute of Astronomical Optics & Technology, Chinese Academy of Sciences, Nanjing, ChinaLaboratory of Solar and Space Instruments, Nanjing Institute of Astronomical Optics & Technology, Chinese Academy of Sciences, Nanjing, ChinaLaboratory of Solar and Space Instruments, Nanjing Institute of Astronomical Optics & Technology, Chinese Academy of Sciences, Nanjing, ChinaLaboratory of Solar and Space Instruments, Nanjing Institute of Astronomical Optics & Technology, Chinese Academy of Sciences, Nanjing, ChinaMiniaturized spectrometers show great application potential in biology, medicine, astronomy and so on. However, it is still challenging to obtain broadband spectrum and high spectral resolution simultaneously with limited size. In this study, we proposed a single waveguide spectrometer based on light scattering of the defects buried in the waveguide. The detections of the scattering light are set on the upper surface of the waveguide, as a result, tremendous detection channels can be realized even within a small structure size, which makes simultaneously high resolution and broad bandwidth detection achievable. Simulation studies show that this kind of spectrometer can exhibits an impressive bandwidth of 1000 nm, ranging from 600 to 1600 nm. Additionally, a resolution of 0.2 nm is achieved within the range of 850 to 852 nm through fine sampling. The influence factors of the performance of the spectrometer is also studied. This work provides the possibility of achieving on-chip, high-resolution, and wide-bandwidth spectrometers.https://ieeexplore.ieee.org/document/10937772/Miniaturized spectrometerwaveguidereconstruction spectrometer |
| spellingShingle | Xue Tong Zhenning Zhao Yunxian Zhong Dong Lin Zhuangzhuang Zhu Qing Zhong Jinping He A Single Waveguide Spectrometer via Defect Scattering IEEE Photonics Journal Miniaturized spectrometer waveguide reconstruction spectrometer |
| title | A Single Waveguide Spectrometer via Defect Scattering |
| title_full | A Single Waveguide Spectrometer via Defect Scattering |
| title_fullStr | A Single Waveguide Spectrometer via Defect Scattering |
| title_full_unstemmed | A Single Waveguide Spectrometer via Defect Scattering |
| title_short | A Single Waveguide Spectrometer via Defect Scattering |
| title_sort | single waveguide spectrometer via defect scattering |
| topic | Miniaturized spectrometer waveguide reconstruction spectrometer |
| url | https://ieeexplore.ieee.org/document/10937772/ |
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