Modelling Metrological Traceability

Metrological traceability is essential for ensuring the accuracy of measurement results and enabling a comparison of results to support decision-making in society. This paper explores a structured approach to modelling traceability chains, focusing on the role of residual measurement errors and thei...

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Main Author: Blair D. Hall
Format: Article
Language:English
Published: MDPI AG 2025-05-01
Series:Metrology
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Online Access:https://www.mdpi.com/2673-8244/5/2/25
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author Blair D. Hall
author_facet Blair D. Hall
author_sort Blair D. Hall
collection DOAJ
description Metrological traceability is essential for ensuring the accuracy of measurement results and enabling a comparison of results to support decision-making in society. This paper explores a structured approach to modelling traceability chains, focusing on the role of residual measurement errors and their impact on measurement accuracy. This work emphasises a scientific description of these errors as physical quantities. By adopting a simple modelling framework grounded in physical principles, the paper offers a formal way to account for the effects of errors through an entire traceability chain, from primary reference standards to end users. Real-world examples from microwave and optical metrology highlight the effectiveness of this rigorous modelling approach. Additionally, to further advance digital systems development in metrology, the paper advocates a formal semantic structure for modelling, based on principles of Model-Driven Architecture. This architectural approach will enhance the clarity of metrological practices and support ongoing efforts toward the digital transformation of international metrology infrastructure.
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spelling doaj-art-1014a7c03e9343109194a8d446ff0f642025-08-20T02:20:59ZengMDPI AGMetrology2673-82442025-05-01522510.3390/metrology5020025Modelling Metrological TraceabilityBlair D. Hall0Measurement Standards Laboratory of New Zealand, Lower Hutt 5010, New ZealandMetrological traceability is essential for ensuring the accuracy of measurement results and enabling a comparison of results to support decision-making in society. This paper explores a structured approach to modelling traceability chains, focusing on the role of residual measurement errors and their impact on measurement accuracy. This work emphasises a scientific description of these errors as physical quantities. By adopting a simple modelling framework grounded in physical principles, the paper offers a formal way to account for the effects of errors through an entire traceability chain, from primary reference standards to end users. Real-world examples from microwave and optical metrology highlight the effectiveness of this rigorous modelling approach. Additionally, to further advance digital systems development in metrology, the paper advocates a formal semantic structure for modelling, based on principles of Model-Driven Architecture. This architectural approach will enhance the clarity of metrological practices and support ongoing efforts toward the digital transformation of international metrology infrastructure.https://www.mdpi.com/2673-8244/5/2/25metrological traceabilitymeasurement errormeasurement uncertaintycalibrationdigital transformation
spellingShingle Blair D. Hall
Modelling Metrological Traceability
Metrology
metrological traceability
measurement error
measurement uncertainty
calibration
digital transformation
title Modelling Metrological Traceability
title_full Modelling Metrological Traceability
title_fullStr Modelling Metrological Traceability
title_full_unstemmed Modelling Metrological Traceability
title_short Modelling Metrological Traceability
title_sort modelling metrological traceability
topic metrological traceability
measurement error
measurement uncertainty
calibration
digital transformation
url https://www.mdpi.com/2673-8244/5/2/25
work_keys_str_mv AT blairdhall modellingmetrologicaltraceability