Modelling Metrological Traceability
Metrological traceability is essential for ensuring the accuracy of measurement results and enabling a comparison of results to support decision-making in society. This paper explores a structured approach to modelling traceability chains, focusing on the role of residual measurement errors and thei...
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| Format: | Article |
| Language: | English |
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MDPI AG
2025-05-01
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| Series: | Metrology |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2673-8244/5/2/25 |
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| Summary: | Metrological traceability is essential for ensuring the accuracy of measurement results and enabling a comparison of results to support decision-making in society. This paper explores a structured approach to modelling traceability chains, focusing on the role of residual measurement errors and their impact on measurement accuracy. This work emphasises a scientific description of these errors as physical quantities. By adopting a simple modelling framework grounded in physical principles, the paper offers a formal way to account for the effects of errors through an entire traceability chain, from primary reference standards to end users. Real-world examples from microwave and optical metrology highlight the effectiveness of this rigorous modelling approach. Additionally, to further advance digital systems development in metrology, the paper advocates a formal semantic structure for modelling, based on principles of Model-Driven Architecture. This architectural approach will enhance the clarity of metrological practices and support ongoing efforts toward the digital transformation of international metrology infrastructure. |
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| ISSN: | 2673-8244 |