Automated Internal Defect Identification and Localization Based on a Near-Field SAR Millimeter-Wave Imaging System
Fast and cost-effective detection of internal defects is essential for structural integrity inspection in various applications such as manufacturing, construction, and aerospace. Current internal non-destructive testing (NDT) methods, such as computed tomography, can be costly, time-consuming, and c...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2025-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10872942/ |
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