Development of Residual Dense U-Net (RDU-Net)-Based Metal Artefacts Reduction Technique Using Spectral Photon Counting CT

Development of Residual Dense U-Net (RDU-Net)-Based Metal Artefacts Reduction Technique Using Spectral Photon Counting CT

Metal induced artefacts in computed tomography (CT) images are primarily caused by beam hardening, scatter effects, and photon starvation. These artefacts impede the characterization of fine anatomical structures and compromise the diagnostic value of the CT images. We aim to develop an innovative m...

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Bibliographic Details
Main Authors: Osama Khan, Briya Tariq, Nadine Francis, Nabil Maalej, Abderaouf Behouch, Amer Kashif, Asim Waris, Aamir Raja
Format: Article
Language:English
Published: IEEE 2024-01-01
Series:IEEE Access
Subjects:
Computed tomography (CT)
metal artefacts reduction (MAR)
spectral photon-counting CT (SPCCT)
Online Access:https://ieeexplore.ieee.org/document/10630472/
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