Helium Leak Measurements as a Predictor of Hermetic Package Life in Surgically-implanted Microelectronic Devices
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| Main Author: | |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Wiley
1980-01-01
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| Series: | Active and Passive Electronic Components |
| Online Access: | http://dx.doi.org/10.1155/APEC.6.263 |
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| _version_ | 1849309128088879104 |
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| author | P. E. K. Donaldson |
| author_facet | P. E. K. Donaldson |
| author_sort | P. E. K. Donaldson |
| collection | DOAJ |
| format | Article |
| id | doaj-art-0cf9df9071514417be9255acbca2c5f4 |
| institution | Kabale University |
| issn | 0882-7516 1563-5031 |
| language | English |
| publishDate | 1980-01-01 |
| publisher | Wiley |
| record_format | Article |
| series | Active and Passive Electronic Components |
| spelling | doaj-art-0cf9df9071514417be9255acbca2c5f42025-08-20T03:54:15ZengWileyActive and Passive Electronic Components0882-75161563-50311980-01-0163-426326310.1155/APEC.6.263Helium Leak Measurements as a Predictor of Hermetic Package Life in Surgically-implanted Microelectronic DevicesP. E. K. Donaldsonhttp://dx.doi.org/10.1155/APEC.6.263 |
| spellingShingle | P. E. K. Donaldson Helium Leak Measurements as a Predictor of Hermetic Package Life in Surgically-implanted Microelectronic Devices Active and Passive Electronic Components |
| title | Helium Leak Measurements as a Predictor of Hermetic Package Life in Surgically-implanted Microelectronic Devices |
| title_full | Helium Leak Measurements as a Predictor of Hermetic Package Life in Surgically-implanted Microelectronic Devices |
| title_fullStr | Helium Leak Measurements as a Predictor of Hermetic Package Life in Surgically-implanted Microelectronic Devices |
| title_full_unstemmed | Helium Leak Measurements as a Predictor of Hermetic Package Life in Surgically-implanted Microelectronic Devices |
| title_short | Helium Leak Measurements as a Predictor of Hermetic Package Life in Surgically-implanted Microelectronic Devices |
| title_sort | helium leak measurements as a predictor of hermetic package life in surgically implanted microelectronic devices |
| url | http://dx.doi.org/10.1155/APEC.6.263 |
| work_keys_str_mv | AT pekdonaldson heliumleakmeasurementsasapredictorofhermeticpackagelifeinsurgicallyimplantedmicroelectronicdevices |