Donaldson, P. E. K. Helium Leak Measurements as a Predictor of Hermetic Package Life in Surgically-implanted Microelectronic Devices. Wiley.
Chicago Style (17th ed.) CitationDonaldson, P. E. K. Helium Leak Measurements as a Predictor of Hermetic Package Life in Surgically-implanted Microelectronic Devices. Wiley.
MLA (9th ed.) CitationDonaldson, P. E. K. Helium Leak Measurements as a Predictor of Hermetic Package Life in Surgically-implanted Microelectronic Devices. Wiley.
Warning: These citations may not always be 100% accurate.