Unified Multi-Abstraction-Level Functional Testing and Performance Measurements for Industrial IoT in Spatially Distributed Narrow Band-Wireless Wide Area Networks

Unified Multi-Abstraction-Level Functional Testing and Performance Measurements for Industrial IoT in Spatially Distributed Narrow Band-Wireless Wide Area Networks

Narrow Band-Wireless Wide Area Networking (NB-WWAN) technologies are becoming more popular across a wide range of application domains due to their ability to provide spatially distributed and reliable wireless connectivity in addition to offering low data rates, low bandwidth, long-range, and long b...

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Bibliographic Details
Main Authors: Jubin Sebastian E, Fabian Sowieja, Axel Sikora
Format: Article
Language:English
Published: MDPI AG 2024-11-01
Series:Sensors
Subjects:
IoT
SDWN
LPWAN
test and measurements
test methodology
testbeds
Online Access:https://www.mdpi.com/1424-8220/24/23/7579
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