Sun, X., Cai, Q., Qi, J., Liu, B., Zheng, Y., Zhang, R., . . . Lee, Y. Temperature-Dependent Spectroscopic Ellipsometry and Modeling of the Optical Properties of Vanadium Dioxide Thin Films. MDPI AG.
Chicago Style (17th ed.) CitationSun, Xiaojie, et al. Temperature-Dependent Spectroscopic Ellipsometry and Modeling of the Optical Properties of Vanadium Dioxide Thin Films. MDPI AG.
MLA (9th ed.) CitationSun, Xiaojie, et al. Temperature-Dependent Spectroscopic Ellipsometry and Modeling of the Optical Properties of Vanadium Dioxide Thin Films. MDPI AG.
Warning: These citations may not always be 100% accurate.