Application of Mask R-CNN and YOLOv8 algorithms for defect detection in printed circuit board manufacturing
Abstract In the last decades, machine vision and Machine Learning (ML) techniques have seen significant improvements in developing new algorithms thanks to the increment of hardware performance. Exploiting machine vision for specific technological applications became an essential opportunity to intr...
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| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Springer
2025-03-01
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| Series: | Discover Applied Sciences |
| Subjects: | |
| Online Access: | https://doi.org/10.1007/s42452-025-06641-x |
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