XPS Studies of LSCF Interfaces after Cell Testing
The motivation of this investigation is to explore the possibility of using the depth profile capability of XPS to study interfaces after SOFC button cell testing. The literature uses XPS to study various cathode materials but has devoted little to the understanding of various cathode interfaces esp...
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| Format: | Article |
| Language: | English |
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Wiley
2018-01-01
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| Series: | Advances in Materials Science and Engineering |
| Online Access: | http://dx.doi.org/10.1155/2018/7561561 |
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| _version_ | 1832548031929516032 |
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| author | Gianfranco DiGiuseppe Venkatesh Boddapati Hiten Mothikhana |
| author_facet | Gianfranco DiGiuseppe Venkatesh Boddapati Hiten Mothikhana |
| author_sort | Gianfranco DiGiuseppe |
| collection | DOAJ |
| description | The motivation of this investigation is to explore the possibility of using the depth profile capability of XPS to study interfaces after SOFC button cell testing. The literature uses XPS to study various cathode materials but has devoted little to the understanding of various cathode interfaces especially after testing. In this work, an SOFC button cell is first tested, and then, the LSCF cathode, barrier layer, and electrolyte are sputtered away to study the behavior of different interfaces. This work has shown that some elements have moved into other layers of the SOFC cell. It is argued that the migration of the elements is partly due to a redeposition mechanism after atoms are sputtered away, while the rest is due to interdiffusion between the SDC and YSZ layers. However, additional work is needed to better understand the mechanism by which atoms move around at different interfaces. The cell electrochemical performance is also discussed in some details but is not the focus. |
| format | Article |
| id | doaj-art-09d39ee95127487d85b3753ad3f3482d |
| institution | Kabale University |
| issn | 1687-8434 1687-8442 |
| language | English |
| publishDate | 2018-01-01 |
| publisher | Wiley |
| record_format | Article |
| series | Advances in Materials Science and Engineering |
| spelling | doaj-art-09d39ee95127487d85b3753ad3f3482d2025-02-03T06:42:15ZengWileyAdvances in Materials Science and Engineering1687-84341687-84422018-01-01201810.1155/2018/75615617561561XPS Studies of LSCF Interfaces after Cell TestingGianfranco DiGiuseppe0Venkatesh Boddapati1Hiten Mothikhana2Department of Mechanical Engineering, Kettering University, 1700 University Avenue, Flint, MI 48504-4898, USADepartment of Mechanical Engineering, Kettering University, 1700 University Avenue, Flint, MI 48504-4898, USADepartment of Mechanical Engineering, Kettering University, 1700 University Avenue, Flint, MI 48504-4898, USAThe motivation of this investigation is to explore the possibility of using the depth profile capability of XPS to study interfaces after SOFC button cell testing. The literature uses XPS to study various cathode materials but has devoted little to the understanding of various cathode interfaces especially after testing. In this work, an SOFC button cell is first tested, and then, the LSCF cathode, barrier layer, and electrolyte are sputtered away to study the behavior of different interfaces. This work has shown that some elements have moved into other layers of the SOFC cell. It is argued that the migration of the elements is partly due to a redeposition mechanism after atoms are sputtered away, while the rest is due to interdiffusion between the SDC and YSZ layers. However, additional work is needed to better understand the mechanism by which atoms move around at different interfaces. The cell electrochemical performance is also discussed in some details but is not the focus.http://dx.doi.org/10.1155/2018/7561561 |
| spellingShingle | Gianfranco DiGiuseppe Venkatesh Boddapati Hiten Mothikhana XPS Studies of LSCF Interfaces after Cell Testing Advances in Materials Science and Engineering |
| title | XPS Studies of LSCF Interfaces after Cell Testing |
| title_full | XPS Studies of LSCF Interfaces after Cell Testing |
| title_fullStr | XPS Studies of LSCF Interfaces after Cell Testing |
| title_full_unstemmed | XPS Studies of LSCF Interfaces after Cell Testing |
| title_short | XPS Studies of LSCF Interfaces after Cell Testing |
| title_sort | xps studies of lscf interfaces after cell testing |
| url | http://dx.doi.org/10.1155/2018/7561561 |
| work_keys_str_mv | AT gianfrancodigiuseppe xpsstudiesoflscfinterfacesaftercelltesting AT venkateshboddapati xpsstudiesoflscfinterfacesaftercelltesting AT hitenmothikhana xpsstudiesoflscfinterfacesaftercelltesting |