APA (7th ed.) Citation

Trötschler, T., Al-Hajjawi, S., Raghavendran, S., Haunschild, J., Demant, M., & Rein, S. Deep-Learning Based Depth-Tracking of Stacking-Faults in Epitaxially Grown Silicon Wafers. TIB Open Publishing.

Chicago Style (17th ed.) Citation

Trötschler, Theresa, Saed Al-Hajjawi, Siddharth Raghavendran, Jonas Haunschild, Matthias Demant, and Stefan Rein. Deep-Learning Based Depth-Tracking of Stacking-Faults in Epitaxially Grown Silicon Wafers. TIB Open Publishing.

MLA (9th ed.) Citation

Trötschler, Theresa, et al. Deep-Learning Based Depth-Tracking of Stacking-Faults in Epitaxially Grown Silicon Wafers. TIB Open Publishing.