APA (7th ed.) Citation

Wang, Z., Li, G., & Tang, M. Study on Single-Event Transient Hardness of Semi-Enclosed Gate NMOS. MDPI AG.

Chicago Style (17th ed.) Citation

Wang, Zhuoxiang, Gang Li, and Minghua Tang. Study on Single-Event Transient Hardness of Semi-Enclosed Gate NMOS. MDPI AG.

MLA (9th ed.) Citation

Wang, Zhuoxiang, et al. Study on Single-Event Transient Hardness of Semi-Enclosed Gate NMOS. MDPI AG.