APA (7th ed.) Citation

Silva, C. S. d., Beyer, C., Boos, J., Kumar, S., Modena, M., Valentin, T., . . . Revol, V. Sensitivity Characterization of an Impedance-Based Platform for Viability Analysis of 3D Spheroids. MDPI AG.

Chicago Style (17th ed.) Citation

Silva, Claudia Sampaio da, Christian Beyer, Julia Boos, Sreedhar Kumar, Mario Modena, Thomas Valentin, Andreas Hierlemann, and Vincent Revol. Sensitivity Characterization of an Impedance-Based Platform for Viability Analysis of 3D Spheroids. MDPI AG.

MLA (9th ed.) Citation

Silva, Claudia Sampaio da, et al. Sensitivity Characterization of an Impedance-Based Platform for Viability Analysis of 3D Spheroids. MDPI AG.