Electrical Characteristics of ML and BL MoS<sub>2</sub> GAA NS FETs With Source/Drain Metal Contacts

This paper reports source/drain (S/D) contact issues in monolayer and bilayer (BL) <inline-formula> <tex-math notation="LaTeX">$\mathrm {MoS_{2}}$ </tex-math></inline-formula> devices through density-functional-theory (DFT) calculation and device simulation. We begi...

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Bibliographic Details
Main Authors: Yueh-Ju Chan, Min-Hui Chuang, Yiming Li
Format: Article
Language:English
Published: IEEE 2025-01-01
Series:IEEE Journal of the Electron Devices Society
Subjects:
Online Access:https://ieeexplore.ieee.org/document/11017515/
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