A Comprehensive Characterization Procedure for Resonant MEMS Scanning Mirrors

We demonstrate an experimental assessment of a high-Q, high-angle piezoelectric (2 µm PZT) MEMS scanning micromirror featuring distributed backside reinforcement, suitable for applications demanding energy-efficient and high-quality image projection. Frequency response measurements at 10 different v...

Full description

Saved in:
Bibliographic Details
Main Authors: Clement Fleury, Markus Bainschab, Gianluca Mendicino, Roberto Carminati, Pooja Thakkar, Dominik Holzmann, Sara Guerreiro, Adrien Piot
Format: Article
Language:English
Published: MDPI AG 2024-04-01
Series:Proceedings
Subjects:
Online Access:https://www.mdpi.com/2504-3900/97/1/144
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:We demonstrate an experimental assessment of a high-Q, high-angle piezoelectric (2 µm PZT) MEMS scanning micromirror featuring distributed backside reinforcement, suitable for applications demanding energy-efficient and high-quality image projection. Frequency response measurements at 10 different vacuum levels ranging from atmospheric pressure to 10<sup>−6</sup> mbar allow for the quantitative separation of damping mechanisms (air and structural). Stroboscopic digital holographic microscopy was used to assess the static and dynamic deformation of the mirror surface. The experimental results are in good agreement with simulations and models.
ISSN:2504-3900