Geng, J., Deng, J., Bai, Z., Wen, X., Lu, J., Yan, Q., & Yang, X. Surface quality prediction and validation of Electro-Fenton chemical mechanical polishing for single crystal SiC based on neural network models. Elsevier.
Chicago Style (17th ed.) CitationGeng, Jiacheng, Jiayun Deng, Zilei Bai, Xiaoning Wen, Jiabin Lu, Qiusheng Yan, and Xiaojing Yang. Surface Quality Prediction and Validation of Electro-Fenton Chemical Mechanical Polishing for Single Crystal SiC Based on Neural Network Models. Elsevier.
MLA (9th ed.) CitationGeng, Jiacheng, et al. Surface Quality Prediction and Validation of Electro-Fenton Chemical Mechanical Polishing for Single Crystal SiC Based on Neural Network Models. Elsevier.
Warning: These citations may not always be 100% accurate.