Research on solder layer void evolution mechanism for IGBT module of electric locomotive in service
As a key component of electric locomotives, the traction converter works for the DC to AC energy conversion through a large power insulated gate bipolar transistor (IGBT), thus exerting control over starting, braking and speed regulation of the AC traction motor. Its reliability is directly related...
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| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | zho |
| Published: |
Editorial Department of Electric Drive for Locomotives
2022-11-01
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| Series: | 机车电传动 |
| Subjects: | |
| Online Access: | http://edl.csrzic.com/thesisDetails#10.13890/j.issn.1000-128X.2022.05.107 |
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| Summary: | As a key component of electric locomotives, the traction converter works for the DC to AC energy conversion through a large power insulated gate bipolar transistor (IGBT), thus exerting control over starting, braking and speed regulation of the AC traction motor. Its reliability is directly related to the operational safety of electric locomotives. Since the solder layer failure is one of the main failure modes of IGBT modules, it is very important to clarify the solder layer defect evolution law, for the sake of reliability of IGBT modules. In this paper, the solder layer of an IGBT module was firstly scanned by CT before and after putting into service of the electric locomotive. The statistical results showed that the number of solder layer voids in the IGBT module with different service mileages was in line with the Poisson distribution, of which the variance (λ) had a mapping relationship with the service mileage of the devices. Secondly, a multi-physical field simulation model of IGBT modules for electric locomotives was established, based on the statistical distribution law of voids and considering the initial defects, and the evolution inducements and law of random voids were studied by means of the strain mathematical description on the upper and lower surfaces of the solder layer. Finally, the relationship among void distribution, size and evolution rate was generated according to the energy-based fatigue lifetime model, which provided a basis for guiding optimal design and active maintenance of the devices. |
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| ISSN: | 1000-128X |