Behaviour of Thin Film TiO2 Overlaid λ/2 Microstrip Rejection Filter Due to Ageing of the Overlay
The long term behaviour of TiO2 thin film overlaid λ/2 L-section rejection filter due to the ageing of the overlay is reported in this paper. The observations are over a period of upto 600 days with exposure to moisture in between. Due to overlay, existence of double resonance peaks and shifts in re...
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Format: | Article |
Language: | English |
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Wiley
1998-01-01
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Series: | Active and Passive Electronic Components |
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Online Access: | http://dx.doi.org/10.1155/1998/92903 |
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author | S. B. Rane Vijaya Puri |
author_facet | S. B. Rane Vijaya Puri |
author_sort | S. B. Rane |
collection | DOAJ |
description | The long term behaviour of TiO2 thin film overlaid λ/2 L-section rejection filter due to
the ageing of the overlay is reported in this paper. The observations are over a period of
upto 600 days with exposure to moisture in between. Due to overlay, existence of double
resonance peaks and shifts in resonance due to the various ageing process is observed.
The circuit after 600 days show a considerable shift in the resonance frequency to higher
frequency side and increase in Q. The long term ageing aspects of the dielectric layers
used for protection, passivation and improvement of circuit properties should be taken
into consideration during design and fabrication. |
format | Article |
id | doaj-art-06ca9a7e8cd642eface462a3d3b896f6 |
institution | Kabale University |
issn | 0882-7516 1563-5031 |
language | English |
publishDate | 1998-01-01 |
publisher | Wiley |
record_format | Article |
series | Active and Passive Electronic Components |
spelling | doaj-art-06ca9a7e8cd642eface462a3d3b896f62025-02-03T01:25:02ZengWileyActive and Passive Electronic Components0882-75161563-50311998-01-0121429730710.1155/1998/92903Behaviour of Thin Film TiO2 Overlaid λ/2 Microstrip Rejection Filter Due to Ageing of the OverlayS. B. Rane0Vijaya Puri1Thin and Thick Film Device Laboratory, Department of Physics, Shivaji University, Kolhapur 416004, IndiaThin and Thick Film Device Laboratory, Department of Physics, Shivaji University, Kolhapur 416004, IndiaThe long term behaviour of TiO2 thin film overlaid λ/2 L-section rejection filter due to the ageing of the overlay is reported in this paper. The observations are over a period of upto 600 days with exposure to moisture in between. Due to overlay, existence of double resonance peaks and shifts in resonance due to the various ageing process is observed. The circuit after 600 days show a considerable shift in the resonance frequency to higher frequency side and increase in Q. The long term ageing aspects of the dielectric layers used for protection, passivation and improvement of circuit properties should be taken into consideration during design and fabrication.http://dx.doi.org/10.1155/1998/92903Overlayrejection filterageing. |
spellingShingle | S. B. Rane Vijaya Puri Behaviour of Thin Film TiO2 Overlaid λ/2 Microstrip Rejection Filter Due to Ageing of the Overlay Active and Passive Electronic Components Overlay rejection filter ageing. |
title | Behaviour of Thin Film TiO2 Overlaid λ/2 Microstrip Rejection Filter Due to Ageing of the Overlay |
title_full | Behaviour of Thin Film TiO2 Overlaid λ/2 Microstrip Rejection Filter Due to Ageing of the Overlay |
title_fullStr | Behaviour of Thin Film TiO2 Overlaid λ/2 Microstrip Rejection Filter Due to Ageing of the Overlay |
title_full_unstemmed | Behaviour of Thin Film TiO2 Overlaid λ/2 Microstrip Rejection Filter Due to Ageing of the Overlay |
title_short | Behaviour of Thin Film TiO2 Overlaid λ/2 Microstrip Rejection Filter Due to Ageing of the Overlay |
title_sort | behaviour of thin film tio2 overlaid λ 2 microstrip rejection filter due to ageing of the overlay |
topic | Overlay rejection filter ageing. |
url | http://dx.doi.org/10.1155/1998/92903 |
work_keys_str_mv | AT sbrane behaviourofthinfilmtio2overlaidl2microstriprejectionfilterduetoageingoftheoverlay AT vijayapuri behaviourofthinfilmtio2overlaidl2microstriprejectionfilterduetoageingoftheoverlay |