High-Precision Diagnosis of the Whole Process of Laser-Induced Plasma and Shock Waves Using Simultaneous Phase-Shift Interferometry

This study employs the simultaneous phase-shift interferometry (SPSI) system to diagnose laser-induced plasma (LIP) and shock wave (SW). In high-density LIP diagnostics, the Faraday rotation effect causes probe light polarization deflection, rendering traditional fixed-phase-demodulation methods ine...

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Bibliographic Details
Main Authors: Lou Gao, Hongchao Zhang, Jian Lu, Zhonghua Shen
Format: Article
Language:English
Published: MDPI AG 2025-06-01
Series:Photonics
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Online Access:https://www.mdpi.com/2304-6732/12/6/601
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Summary:This study employs the simultaneous phase-shift interferometry (SPSI) system to diagnose laser-induced plasma (LIP) and shock wave (SW). In high-density LIP diagnostics, the Faraday rotation effect causes probe light polarization deflection, rendering traditional fixed-phase-demodulation methods ineffective, the Carré phase-recovery algorithm is adopted and its applicability is verified. Uncertainty analysis and precision verification show that the total phase shift uncertainty is controlled within 0.045 radians, equivalent to a refractive index accuracy of <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mn>8.55</mn><mo>×</mo><msup><mn>10</mn><mrow><mo>−</mo><mn>6</mn></mrow></msup></mrow></semantics></math></inline-formula>, with sensitivity to weak perturbations improved by approximately one order of magnitude compared to conventional carrier-frequency interferometry. Experimental results demonstrate that the SPSI system precisely captures the initial spatiotemporal evolution of LIP and tracks shock waves at varying attenuation levels, exhibiting notable advantages in weak shock wave detection. This research validates the SPSI system’s high sensitivity to transient weak perturbations, offering a valuable diagnostic tool for high-vacuum plasmas, low-pressure shock waves, and stress waves in optical materials.
ISSN:2304-6732