Substrate Temperature Effect on Structural Properties Of Bi2Te3 Thin Films
Structural properties of Bi2Te3 thin films, thermally evaporated on well-cleaned glass substrate at different substrate temperature, are reported here. X-ray diffraction was carried out for the structural characterization. XRD pattern of the films exhibits preferential orientation along the [0 1 5]...
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| Format: | Article |
| Language: | English |
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Sumy State University
2011-01-01
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| Series: | Журнал нано- та електронної фізики |
| Subjects: | |
| Online Access: | http://jnep.sumdu.edu.ua/download/numbers/2011/1,%20Part%201/articles/jnep_2011_V3_N1(Part1)_101-105.pdf |
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| author | B.S. Jariwala D.V. Shah Vipul Kheraj |
| author_facet | B.S. Jariwala D.V. Shah Vipul Kheraj |
| author_sort | B.S. Jariwala |
| collection | DOAJ |
| description | Structural properties of Bi2Te3 thin films, thermally evaporated on well-cleaned glass substrate at different substrate temperature, are reported here. X-ray diffraction was carried out for the structural characterization. XRD pattern of the films exhibits preferential orientation along the [0 1 5] direction for the films of all the substrate temperature together with other supported planes [2 0 5] & [1 1 0]. All deposition conditions like thickness, deposition rate and pressure were maintained throughout the experiment. X-ray diffraction lines confirm that, the grown films are polycrystalline in nature with the hexagonal crystal structure. The effect of substrate temperature on these parameters have been investigated and reported in this paper. Various structural parameters such as lattice constants, grain size, micro strain, number of crystallites, stacking fault and dislocation density were calculated using X-ray diffraction analysis. |
| format | Article |
| id | doaj-art-051c28f4b2ef439bb90d3931696683b3 |
| institution | Kabale University |
| issn | 2077-6772 |
| language | English |
| publishDate | 2011-01-01 |
| publisher | Sumy State University |
| record_format | Article |
| series | Журнал нано- та електронної фізики |
| spelling | doaj-art-051c28f4b2ef439bb90d3931696683b32025-08-20T03:54:28ZengSumy State UniversityЖурнал нано- та електронної фізики2077-67722011-01-0131101105Substrate Temperature Effect on Structural Properties Of Bi2Te3 Thin FilmsB.S. JariwalaD.V. ShahVipul KherajStructural properties of Bi2Te3 thin films, thermally evaporated on well-cleaned glass substrate at different substrate temperature, are reported here. X-ray diffraction was carried out for the structural characterization. XRD pattern of the films exhibits preferential orientation along the [0 1 5] direction for the films of all the substrate temperature together with other supported planes [2 0 5] & [1 1 0]. All deposition conditions like thickness, deposition rate and pressure were maintained throughout the experiment. X-ray diffraction lines confirm that, the grown films are polycrystalline in nature with the hexagonal crystal structure. The effect of substrate temperature on these parameters have been investigated and reported in this paper. Various structural parameters such as lattice constants, grain size, micro strain, number of crystallites, stacking fault and dislocation density were calculated using X-ray diffraction analysis.http://jnep.sumdu.edu.ua/download/numbers/2011/1,%20Part%201/articles/jnep_2011_V3_N1(Part1)_101-105.pdfBismuth Telluride Thin FilmsX-Ray DiffractionStructural ParametersDislocation DensityMicro StrainStacking Fault |
| spellingShingle | B.S. Jariwala D.V. Shah Vipul Kheraj Substrate Temperature Effect on Structural Properties Of Bi2Te3 Thin Films Журнал нано- та електронної фізики Bismuth Telluride Thin Films X-Ray Diffraction Structural Parameters Dislocation Density Micro Strain Stacking Fault |
| title | Substrate Temperature Effect on Structural Properties Of Bi2Te3 Thin Films |
| title_full | Substrate Temperature Effect on Structural Properties Of Bi2Te3 Thin Films |
| title_fullStr | Substrate Temperature Effect on Structural Properties Of Bi2Te3 Thin Films |
| title_full_unstemmed | Substrate Temperature Effect on Structural Properties Of Bi2Te3 Thin Films |
| title_short | Substrate Temperature Effect on Structural Properties Of Bi2Te3 Thin Films |
| title_sort | substrate temperature effect on structural properties of bi2te3 thin films |
| topic | Bismuth Telluride Thin Films X-Ray Diffraction Structural Parameters Dislocation Density Micro Strain Stacking Fault |
| url | http://jnep.sumdu.edu.ua/download/numbers/2011/1,%20Part%201/articles/jnep_2011_V3_N1(Part1)_101-105.pdf |
| work_keys_str_mv | AT bsjariwala substratetemperatureeffectonstructuralpropertiesofbi2te3thinfilms AT dvshah substratetemperatureeffectonstructuralpropertiesofbi2te3thinfilms AT vipulkheraj substratetemperatureeffectonstructuralpropertiesofbi2te3thinfilms |